Impedance measurements at the semiconductor-solution interface / J. Leduc and S.M. Ahmed.: M38-13/84-15E-PDF
"The physics and chemistry of the semiconductor-solution interface have been presented in detail with particular reference to impedance measurements and determination of the flat band potential of the semiconductor surface. The basic theory of A.C. circuits applied to impedance measurements at the semiconductor-solution interface has been developed. Techniques for impedance measurements and data analysis have been described for a method using an LCR meter and a computer for experimental control and data acquisition. The necessary software has been developed"--Abstract, page i.
Permanent link to this Catalogue record:
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| Department/Agency | Canada. Energy, Mines and Resources Canada. Canada Centre for Mineral and Energy Technology. Energy Research Program (Canada) Mineral Sciences Laboratories (Canada) |
|---|---|
| Title | Impedance measurements at the semiconductor-solution interface / J. Leduc and S.M. Ahmed. |
| Series title | CANMET report ; 84-15E |
| Publication type | Series - View Master Record |
| Language | [English] |
| Other language editions | [French] |
| Format | Electronic |
| Electronic document | |
| Note(s) | Issued also in French under title: Mesures de l'impédance à l'interface semi-conducteur-solution. Cover title. "June 1985." Issued by: Energy Research Program and Mineral Sciences Laboratories. Digitized edition from print [produced by Natural Resources Canada]. Includes bibliographical references. Includes abstract in French. |
| Publishing information | Ottawa, Canada : Canada Centre for Mineral and Energy Technology = Centre canadien de la technologie des minéraux et de l'énergie, 1985. ©1984 |
| Author / Contributor | Leduc, J. (Jean), 1943- author. Ahmed, S. M. (Syed M.), 1943- author. |
| Description | 1 online resource (iv, 82 pages) : illustrations. |
| Catalogue number |
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| Departmental catalogue number | 307071 |
| Subject terms | Chemistry |